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 SAE Home > Products & Services > Material Science Lab > Cleanliness Lab
Surface Analysis Lab Cleanliness Testing Laboratory Polymer Lab Environmental Lab RoHS Lab ESD Lab Failure Lab
In HDD, Semiconductor industries and micro electronic devices fields, organic and inorganic contaminants may induce corrosion, scratch, and adhesion and break short issues, which affect the product performance and reliability. MSL have the capabilities and rich experiences to perform cleanliness testing of electronic components. In order to ensure that we meet the stringent cleanliness specification required by the electronic industries, we have established a systematic quality control system to achieve high accuracy and high precision. The services include: cleanliness test and evaluation for incoming and products; providing complete analysis techniques and solution for micro contamination control.

Dionex DX-600IC

  • Cleanliness Testing for electronic products and components
  • Testing for ultrapure water and electronic grade chemicals
  • Testing for Cleanroom air quality
  • Testing for Cleanroom air quality
  • Water cleaning line monitor
Test Item:
  • 离子含量分析 (IC)
  • 非挥发性残留物分析(NVR)
  • 硅油/DOP/酰胺分析(FTIR)
  • 液体颗粒计数 (LPC)
  • 磁性颗粒检查 (Magnetic particle)
  • 有机挥发物 (Outgassing)
  • 可冷凝的挥发物残留 (CVR)
  • 可萃取的痕量金属 (ICP-MS)
  • ASTM
  • IEST
  • ISO
  • MIL
  • GB/T

PE Spectrum GX FTIR.

表面污染物分析 (Surface contaminants)
  • 液体颗粒计数仪(HIAC/ROYCO3000A、PMS LS-200 LPC)
  • 离子色谱仪(DIONEX DX-500, DX-600, ICS-1500 IC)
  • 气相色谱质谱联用仪 (HP 6890GC/HP5973MSD)
  • 动态顶空进样器(PE HS-40XL Headspace sampler (SHS)
  • 静态顶空进样器(PE ATD-50 Automated thermal desorber)
  • 热裂解进样器(JAI Curie Point Pyrolyzer JHP-3)
  • 傅里叶转换红外光谱仪(Nicolet Magna-IR 560/5700 FTIR)
  • 傅里叶转换红外显微镜 (PE spectrum GX FT-microscope)
  • 微量电子天平(Micro electronic balance)
  • 热差失重分析仪/差失扫描量热仪PE TGA-7 / PE DSC-7
  • 电感耦合等离子质谱仪(Thermo X-Series ICP-MS)
  • 总有机碳分析仪(Model 1051 Analytical 1010 TOC analyzer)
  • 表面张力测试仪 (Surface tension)
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